Cart (Loading....) | Create Account
Close category search window
 

Frequency-resolved optical gating system with a tellurium crystal for characterizing free-electron lasers in the wavelength range of 10–30 μm

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Iijima, Hokuto ; Quantum Beam Science Directorate, Japan Atomic Energy Agency, Tokai, Ibaraki 319-1195, Japan ; Nagai, Ryoji ; Nishimori, Nobuyuki ; Hajima, R.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.3265318 

A second-harmonic generation frequency-resolved optical gating (SHG-FROG) system has been developed for the complete characterization of laser pulses in the wavelength range of 10–30 μm. A tellurium crystal is used so that spectrally resolved autocorrelation signals with a good signal-to-noise ratio are obtained. Pulses (wavelength ∼22 μm) generated from a free-electron laser are measured by the SHG-FROG system. The SHG intensity profile and the spectrum obtained by FROG measurements are well consistent with those of independent measurements of the pulse length and spectrum. The pulse duration and spectral width determined from the FROG trace are 0.6 ps and 5.2 THz at full width half maximum, respectively.

Published in:

Review of Scientific Instruments  (Volume:80 ,  Issue: 12 )

Date of Publication:

Dec 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.