Referenced Items are not available for this document.
SoC testing scheduling is an NP hard problem, and it is more complex for the hierarchical SoC architecture. By formulating the SoC testing scheduling problem as a 2-D bin-packing model, this paper solves the problem for the hierarchical SoC with the ant colony optimization (ACO) algorithm to reduce testing application time. Experimental results on ITC'02 benchmark circuits show that the ACO algorithm is more effective than earlier proposed methods.
Published in:
ASIC, 2009. ASICON '09. IEEE 8th International Conference on
Date of Conference: 20-23 Oct. 2009
- Page(s):
- 1221 - 1224
- E-ISBN :
- 978-1-4244-3870-9
- Print ISBN:
- 978-1-4244-3868-6
- INSPEC Accession Number:
- 11009399
- Conference Location :
- Changsha, Hunan
- Digital Object Identifier :
- 10.1109/ASICON.2009.5351198
- Product Type:
- Conference Publications
About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies
A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.
