Cart (Loading....) | Create Account
Close category search window
 

Current Interruption in Low-Voltage Circuit Breakers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Balestrero, A. ; ABB S.p.A., Bergamo, Italy ; Ghezzi, L. ; Popov, M. ; van der Sluis, L.

Low-voltage current interruption is studied in this paper in order to develop a suitable blackbox model for low-voltage circuit breakers. The electric arc will be modeled by means of electrical quantities. Accurate post-arc current measurements by a high sensitivity current probe and signal analysis techniques (Savitsky-Golay filtering) are adopted to extract information. A set of interrupting performance evaluators is proposed, and the best performing indicators are selected. Theoretical explanations provide insight in the physical processes of low-voltage interruption. The difference with the classical context of blackbox modeling in medium- and high-voltage circuit breakers is explained, based on the different relative weight of the arc voltage and voltage supply.

Published in:

Power Delivery, IEEE Transactions on  (Volume:25 ,  Issue: 1 )

Date of Publication:

Jan. 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.