Cart (Loading....) | Create Account
Close category search window
 

Development of Arc-Guided Protection Devices Against Lightning Breakage of Covered Conductors on Distribution Lines

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Weijiang Chen ; UHV Div., State Grid Cooperation of China, Beijing, China ; Shanqiang Gu ; Jinliang He ; Bin Yin

The breakage of overhead covered conductors on distribution lines resulting from the short-circuit arcs caused by lightning flash becomes a challenge as the application of covered conductors increases on distribution lines. Based on various methodologies and devices developed to avoid the covered conductor breakage in the world, novel arc-guided devices, including arcing protection hardware with barbs, clamping post composite insulator, and barb electrode clamping post porcelain/composite insulator are presented in this paper. Experimental results are also presented to validate these new developed devices. Devices based on the developed technologies have been widely applied on the power grids in China successfully.

Published in:

Power Delivery, IEEE Transactions on  (Volume:25 ,  Issue: 1 )

Date of Publication:

Jan. 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.