Cart (Loading....) | Create Account
Close category search window
 

Improving coverage in mobile sensor networks using overlap concept

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Farahani, B.J. ; Comput. Eng. Sch., Iran Univ. of Sci. & Technol., Tehran, Iran ; Fathy, M.

In this paper we proposed a new approach for improving distribution and coverage of mobile sensors in a target filed. The goal is to deploy sensors such that a target area is optimally covered by them. Proposed method works based on number of neighbors. The nodes which have the minimum overlaps with its neighbors start to move away according to summation of forces from their neighbors, boundaries and obstacles. In order to achieve optimum coverage, the effect of field corners is also calculated. For evaluating the effectiveness of our proposed algorithm, we compared the performance of our algorithm with TRI and VEC which are well known algorithms in field of mobile sensors coverage. Simulation results show that our algorithm surely surpasses TRI and VEC in coverage.

Published in:

Computer Conference, 2009. CSICC 2009. 14th International CSI

Date of Conference:

20-21 Oct. 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.