Cart (Loading....) | Create Account
Close category search window
 

SWML: A workflow modeling language based on stochastic activity networks

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Mottaghi, F.J. ; Dept. of Comput. Eng., Iran Univ. of Sci. & Technol., Tehran, Iran ; Azgomi, M.A.

The existing workflow modeling languages have some limitations and drawbacks. The aim is to introduce a new workflow modeling language based on stochastic activity networks (SANs). SANs are a powerful extension of Petri nets, which have been used in a wide range of applications. SAN-based workflow modeling language (SWML) has some high-level modeling primitives for easily modeling workflow patterns. For analysis of the modeled workflow systems with SWML, we have introduced the transformation techniques from SWML models into ordinary SANs. The transformed models can be analyzed using the existing tools for SANs, such as the Mo¿bius modeling tool. In this paper, we present definitions of SWML modeling language and its primitives and an example of SWML models.

Published in:

Computer Conference, 2009. CSICC 2009. 14th International CSI

Date of Conference:

20-21 Oct. 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.