Cart (Loading....) | Create Account
Close category search window
 

Microwave Imaging in Layered Media: 3-D Image Reconstruction From Experimental Data

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

8 Author(s)
Chun Yu ; Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA ; Mengqing Yuan ; Yangjun Zhang ; Stang, J.
more authors

A prototype microwave imaging system for imaging 3-D targets in layered media is developed to validate the capability of microwave imaging with experimental data and with 3-D nonlinear inverse scattering algorithms. In this experimental prototype, the transmitting and receiving antennas are placed in a rectangular tub containing a fluid. Two plastic slabs are placed in parallel in the fluid to form a five-layer medium. The microwave scattering data are acquired by mechanically scanning a single transmitting antenna and a single receiving antenna, thus avoiding the mutual coupling that occurs when an array is used. The collected 3-D experimental data in the fluid are processed by full 3-D nonlinear inverse scattering algorithms to unravel the complicated multiple scattering effects and produce 3-D digital images of the dielectric constant and conductivity of the imaging domain. The image reconstruction is focused on the position and dimensions of the unknown scatterers. Different dielectric and metallic objects have been imaged effectively at 1.64 GHz.

Published in:

Antennas and Propagation, IEEE Transactions on  (Volume:58 ,  Issue: 2 )

Date of Publication:

Feb. 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.