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Bend loss characterization of direct write rib waveguides induced in Ge0.2Se0.8 chalcogenide glass using electron beams

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2 Author(s)
Hoffman, Galen B. ; Dept. of Electr. & Comput. Eng., Ohio State Univ., Columbus, OH, USA ; Reano, R.M.

Rib waveguides in Ge0.2Se0.8 films are fabricated by the direct write of electron beams. Numerical analysis shows that bend loss decreases with electron beam exposure count for constant bend radius.

Published in:

LEOS Annual Meeting Conference Proceedings, 2009. LEOS '09. IEEE

Date of Conference:

4-8 Oct. 2009