Cart (Loading....) | Create Account
Close category search window
 

FPGA-based low-cost automatic test equipment for digital integrated circuits

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
6 Author(s)
Mostardini, L. ; Dept. of Inf. Eng., Univ. of Pisa, Pisa, Italy ; Bacciarelli, L. ; Fanucci, L. ; Bertini, L.
more authors

Digital circuits complexity and density are increasing while, at the same time, more quality and reliability are required. These trends, together with high test costs, make the validation of VLSI circuits more and more difficult. Beside high-end ATE machines, strictly necessary in ASIC production phase, low-cost ATE test systems take place into market to implement a valid support in ASIC development phase. In this paper a case study of low-cost, reconfigurable, versatile and easy-to-use FPGA-based test environment is presented. It allows patterns to be extracted from HDL-simulation and stimuli to be generated to ASIC prototypes, especially when a high-end test machine setup isn't foreseen or isn't available yet. This is the ideal solution for engineers to develop test programs and perform device tests and yield analysis on their desktop and then transfer the test program directly to production. The result is low-cost automatic test equipment, able to execute a preliminary digital test, using just a laptop and an FPGA-equipped board.

Published in:

Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications, 2009. IDAACS 2009. IEEE International Workshop on

Date of Conference:

21-23 Sept. 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.