Cart (Loading....) | Create Account
Close category search window

Analysis of some modified ordered statistic CFAR: OSGO and OSSO CFAR

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Elias-Fuste, A.R. ; Dept. de Teoria de la Senal y Commun., Univ. Politecnica de Cataluna, Barcelona ; de Mercado, M.G.G. ; de los Reyes Davo, E.

It is necessary for automatic detection radars to be adaptive to variations in background clutter in order to maintain a constant false alarm rate (CFAR). A CFAR based on an ordered statistic technique (OS CFAR) has some advantages over the cell-averaging technique (CA CFAR), especially in clutter edges or multiple target environments; unfortunately the large processing time required by this technique limits its use. The authors present two new OS CFARs that require only ahlf the processing time. One is an ordered statistic greatest of CFAR (OSGO), while the other is an ordered statistic smallest of CFAR (OSSO). The OSGO CFAR has the advantages of the OS CFAR with only a negligible increment to the CFAR loss

Published in:

Aerospace and Electronic Systems, IEEE Transactions on  (Volume:26 ,  Issue: 1 )

Date of Publication:

Jan 1990

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.