By Topic

Spectrally resolved confocal microscopy for laser mode imaging and beam characteristic investigations

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Brezna, W. ; TU-Wien, Institut für Festkörperelektronik, Floragasse 7, A-1040 Wien, Austria ; Smoliner, J.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.3264969 

In this letter, confocal optical microscopy is used to investigate the intensity patterns of an infrared vertical cavity surface emitting laser in three dimensions with high spectral resolution. The measurements were performed between the near field (Fresnel) regime and the far field (Fraunhofer) regime. The calculated intensity patterns were found to be in good agreement with the measured intensity distribution. The calculations together with the measurements can be used to determine the phase relation between different positions inside the gain medium.

Published in:

Applied Physics Letters  (Volume:95 ,  Issue: 20 )