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Single Event Transient Response Dependence on Operating Conditions for a Digital to Analog Converter

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4 Author(s)
Kruckmeyer, K. ; Nat. Semicond., Santa Clara, CA, USA ; Prater, J.S. ; Brown, B. ; DasGupta, Sandeepan

The Single Event Effect (SEE) characterization of a Digital to Analog Converter showed an unexpected Single Event Transient (SET) dependence on operating conditions. The worst case condition resulting in the highest probability of an SET was at the highest supply voltage. The SET signatures were dependent on the input code, with some signatures not present when the input code was at mid scale. The SET characterization results are presented, along with a simulation study that explains the SET response dependence on the operating conditions. These results emphasize the importance of running an SEE characterization on a mixed signal product and monitoring all aspects of the SET signatures, including probability, amplitude, pulse width and oscillatory behavior, to determine the worst case operating conditions.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:56 ,  Issue: 6 )

Date of Publication:

Dec. 2009

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