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TPA Laser and Heavy-Ion SEE Testing: Complementary Techniques for SDRAM Single-Event Evaluation

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10 Author(s)
Ladbury, R.L. ; c/o NASA Goddard Space Flight Center (GSFC), MEI Technol. Inc., Greenbelt, MD, USA ; Benedetto, J. ; McMorrow, D. ; Buchner, S.P.
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We report on complementary use of two-photon absorption laser and heavy-ion SEE testing to evaluate the single-event response of SDRAMs. The tandem testing technique helps disentangle the response of devices exhibiting multiple SEE modes.

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Nuclear Science, IEEE Transactions on  (Volume:56 ,  Issue: 6 )