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Browse Journals & Magazines > Nuclear Science, IEEE Transac ...> Volume:56 Issue:6 Help

TPA Laser and Heavy-Ion SEE Testing: Complementary Techniques for SDRAM Single-Event Evaluation

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10 Author(s)
Ladbury, R.L. ; c/o NASA Goddard Space Flight Center (GSFC), MEI Technol. Inc., Greenbelt, MD, USA ; Benedetto, J. ; McMorrow, D. ; Buchner, S.P.
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We report on complementary use of two-photon absorption laser and heavy-ion SEE testing to evaluate the single-event response of SDRAMs. The tandem testing technique helps disentangle the response of devices exhibiting multiple SEE modes.

Published in:
Nuclear Science, IEEE Transactions on  (Volume:56 ,  Issue: 6 )

Date of Publication: Dec. 2009

Page(s):
3334 - 3340
ISSN :
0018-9499
INSPEC Accession Number:
11019240
Digital Object Identifier :
10.1109/TNS.2009.2033690
Product Type:
Journals & Magazines
Date of Current Version :
08 December 2009
Issue Date :
Dec. 2009
Sponsored by :
IEEE Nuclear and Plasma Sciences Society

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