By Topic

General Framework for Single Event Effects Rate Prediction in Microelectronics

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Robert A. Weller ; Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA ; Robert A. Reed ; Kevin M. Warren ; Marcus H. Mendenhall
more authors

A comprehensive mathematical framework is established that encompasses both Monte Carlo single event effects (SEE) rate prediction and analytical approximations based on a single rectangular parallelepiped (RPP). Criteria derived from consideration of multiple devices and technologies are presented that are useful in identifying situations where RPP-model predictions of SEE rates may not be appropriate and should be augmented or replaced by advanced physical modeling.

Published in:

IEEE Transactions on Nuclear Science  (Volume:56 ,  Issue: 6 )