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General Framework for Single Event Effects Rate Prediction in Microelectronics

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7 Author(s)
Weller, R.A. ; Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA ; Reed, R.A. ; Warren, K.M. ; Mendenhall, M.H.
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A comprehensive mathematical framework is established that encompasses both Monte Carlo single event effects (SEE) rate prediction and analytical approximations based on a single rectangular parallelepiped (RPP). Criteria derived from consideration of multiple devices and technologies are presented that are useful in identifying situations where RPP-model predictions of SEE rates may not be appropriate and should be augmented or replaced by advanced physical modeling.

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Nuclear Science, IEEE Transactions on  (Volume:56 ,  Issue: 6 )