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Soft-Error Rate in a Logic LSI Estimated From SET Pulse-Width Measurements

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9 Author(s)
Makino, T. ; Dept. of Space & Astronaut. Sci., Grad. Univ. for Adv. Studies, Sagamihara, Japan ; Kobayashi, D. ; Hirose, K. ; Takahashi, D.
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SET-induced soft-error rates (SERSETs) of logic LSIs are estimated from SET pulse-widths measured in logic cells used in logic LSIs. The estimated rates are consistent with directly measured SERSETs for logic LSIs.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:56 ,  Issue: 6 )

Date of Publication:

Dec. 2009

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