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Browse Conference Publications > EOS/ESD Symposium, 2009 31st ... Help

Protecting circuits from the transient voltage suppressor's residual pulse during IEC 61000-4-2 stress

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5 Author(s)
Marum, S. ; Texas Instrum. Inc, Dallas, TX, USA ; Duvvury, C. ; Jae Park ; Chadwick, A.
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The concept of the ldquoresidual pulserdquo from external IEC 61000-4-2 stress clamps is introduced. Values for this ldquoresidual pulserdquo are determined for some typical transient voltage suppressors. A method of using these data along with an IC's internal ESD protection to provide complete protection from system level stresses is proposed.

Published in:
EOS/ESD Symposium, 2009 31st

Date of Conference: Aug. 30 2009-Sept. 4 2009

Page(s):
1 - 10
E-ISBN :
978-1-58537-176-1
Print ISBN:
978-1-58537-176-1
INSPEC Accession Number:
10985245
Conference Location :
Anaheim, CA

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