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The concept of the ldquoresidual pulserdquo from external IEC 61000-4-2 stress clamps is introduced. Values for this ldquoresidual pulserdquo are determined for some typical transient voltage suppressors. A method of using these data along with an IC's internal ESD protection to provide complete protection from system level stresses is proposed.
EOS/ESD Symposium, 2009 31st
Date of Conference: Aug. 30 2009-Sept. 4 2009