By Topic

A new parameter and its algorithm for network connection reliability: k/N-terminal reliability

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Ruiying Li ; Dept. of Syst. Eng., Beihang Univ., Beijing, China ; Ning Huang ; Rui Kang

Existing network connection reliability parameters can't measure the connection situation of only some terminals in a specified terminal-set. To solve this problem, a new network connection reliability parameter, k/N-terminal reliability, is put forward. It is defined as the probability that at least k terminals of a specified terminal-set N in the network G(V, E, Phi) will connect for a given period of time when used under specified operation conditions, where NsubeV and 2lesklesn. The exact algorithm based on inclusion-exclusion principle is also given. An example is used to illustrate the applicability of this new parameter and its algorithm.

Published in:

Future Information Networks, 2009. ICFIN 2009. First International Conference on

Date of Conference:

14-17 Oct. 2009