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Extended depth of focus in a particle field measurement using a single-shot digital hologram

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3 Author(s)
Chen, Wen ; Department of Mechanical Engineering, National University of Singapore, 9 Engineering Drive 1, Singapore 117576, Singapore ; Quan, Chenggen ; Tay, Cho Jui

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We propose a method to extend the depth of focus in a particle field measurement using a single-shot digital hologram. A focal plane is obtained for each pixel based on an entropy method, and a depth map is subsequently extracted. A synthesized extended focused image is determined correspondingly using the extracted depth map. In addition, a wavelet modulus maxima algorithm and Canny algorithm are further employed to detect the edges of each particle, and the sizes and a three-dimensional localization of the particles are also estimated. Preliminary results are presented to show the feasibility and effectiveness of the proposed technique.

Published in:

Applied Physics Letters  (Volume:95 ,  Issue: 20 )

Date of Publication:

Nov 2009

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