Cart (Loading....) | Create Account
Close category search window
 

Optical image analysis of the novel ultra-lightweight and high-resolution MEMS X-ray optics

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

9 Author(s)
Mitsuishi, I. ; Inst. of Space & Astronaut. Sci. (ISAS), Japan Aerosp. Exploration Agency (JAXA), Japan ; Ezoe, Y. ; Takagi, U. ; Hayashi, T.
more authors

We invented novel ultra-lightweight and high-resolution MEMS (Micro Electro Mechanical Systems) X-ray optics for space X-ray telescopes. As a first step of R&D, we conducted optical image analysis of a spherically-shaped test optic with a radius of curvature of 1000 mm. Focusing of the parallel light was verified with our optic for the first time.

Published in:

Optical MEMS and Nanophotonics, 2009 IEEE/LEOS International Conference on

Date of Conference:

17-20 Aug. 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.