Referenced Items are not available for this document.
The yield learning problem encountered in many manufacturing systems involves controlling the production rate of a process so as to maximize cumulative rewards over some time interval. Because yield improvement occurs as a result of discrete events coinciding with lot processing completions, a basic tradeoff arises as high production rates increase rewards for a given yield but also cause longer average lot lead times which delay the events that trigger yield improvement. We show that in some cases simple bang-bang solutions can be obtained for this problem through standard optimal control techniques
Published in:
Automatic Control, IEEE Transactions on
(Volume:41
,
Issue:
8
)
Date of Publication: Aug 1996
- Page(s):
- 1210 - 1213
- ISSN :
- 0018-9286
- INSPEC Accession Number:
- 5360228
- Digital Object Identifier :
- 10.1109/9.533687
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 06 August 2002
- Issue Date :
- Aug 1996
- Sponsored by :
- IEEE Control Systems Society
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