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Voltage references which are suitable for low Earth orbit space missions were irradiated at low dose rate with gamma particles by INTA (Institute Nacional de Tecnica Aeroespacial). The aim of this work is to analyze the enhancement of low dose rate sensitivity in this type of devices, based on bipolar as well as CMOS technology. For this purpose, parameters such as output voltage, load regulation and supply current were measured. Results and conclusions about the components radiation hardness assurance are reported.