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Single Event Effects in MEMS Accelerometers

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5 Author(s)
Oudea, C. ; EADS-Astrium Space Transp., Les Mureaux, France ; Poirot, P. ; Gaillard, R. ; Poivey, C.
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We present single event effects, induced by heavy ions and protons, on a COTS MEMS accelerometer. The testing procedure is outlined and the contributions from different parts of the accelerometer are discussed.

Published in:

Radiation Effects Data Workshop, 2009 IEEE

Date of Conference:

20-24 July 2009