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Single Event Upset Characterization of the TMS320C6713 Digital Signal Processor Using Proton Irradiation

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1 Author(s)
Hiemstra, D.M. ; MDA, Brampton, ON, Canada

The proton induced SEU cross-section of the TMS320C6713 digital signal processor's functional blocks are presented. The cross-sections are used to estimate the upset rates in the space radiation environment.

Published in:

Radiation Effects Data Workshop, 2009 IEEE

Date of Conference:

20-24 July 2009