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FX: a fast approximate fault simulator for the switch-level using VHDL

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2 Author(s)
Ryan, C.A. ; Texas Instrum. Inc., Stafford, TX, USA ; Tront, J.G.

Switch-level faults, as opposed to traditional gate-level faults, can more accurately model physical failures found in an integrated circuit. However, one problem with switch-level fault simulation is that of long simulation times. This paper addresses this problem by performing fast approximate switch-level fault simulation using transistor reverse level ordering, and a novel nine-valued switch-level extension to observability. The probability of propagation of a fault from an arbitrary line of the switch-level circuit to the primary output is shown to be a function of the average node fan-in and the line's distance to primary output. Using this probability, results show one order of magnitude of complexity speed-up as compared to traditional fault simulation techniques, while maintaining good accuracy.

Published in:

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on  (Volume:4 ,  Issue: 3 )