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Thickness and Refractive Index Measurements by Full-Field Optical Coherence Microscopy

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6 Author(s)
Jihoon Na ; Gwangju Inst. of Sci. & Technol., Gwangju, South Korea ; Choi, W.J. ; Hae Young Choi ; Seon Young Ryu
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We present the noble sensing method that can simultaneously measure the physical thickness and the refractive index of a transparent specimen based on full-field optical coherence microscopy. As a sample, a small drop of epoxy was placed on a flat glass plate and high-resolution depth resolved en-face images were taken. With adopting the reference plane from a cross-sectional image, the physical thickness, and the refractive index distribution could be obtained.

Published in:

Sensors Journal, IEEE  (Volume:9 ,  Issue: 12 )

Date of Publication:

Dec. 2009

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