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A RISC architecture with two-size, overlapping register windows

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1 Author(s)
Furht, B. ; Fac. of Electr. & Comput. Eng., Miami Univ., Coral Gables, FL, USA

The issues involved in designing multiple-register window schemes are examined, and fixed-size, variable-size and two-size window organizations are discussed. These three multiple-register approaches are compared. A detailed example is presented, showing that the proposed two-size register window scheme has significant advantages over both fixed-size and variable-size schemes. A prototype design is presented.<>

Published in:

Micro, IEEE  (Volume:8 ,  Issue: 2 )