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A Method to Estimate the Junction Temperature of Photodetectors Operating at High Photocurrent

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4 Author(s)
Hao Chen ; Dept. of Electr. & Comput. Eng., Univ. of Virginia, Charlottesville, VA, USA ; Beling, A. ; Huapu Pan ; Campbell, Joe C.

A method to estimate the junction temperature while operating at high photocurrent levels is presented. The relative responsivity change is measured at high operating current. Using a model for the temperature-dependence of the bandgap, a relation between the relative change in the output power and the internal junction temperature is derived. Good agreement between experimental data and simulations is achieved.

Published in:

Quantum Electronics, IEEE Journal of  (Volume:45 ,  Issue: 12 )