By Topic

Scanning tunneling microscopy with single crystalline W[001] tips: High resolution studies of Si(557)5×5 surface

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
4 Author(s)
Chaika, A.N. ; Institute of Solid State Physics, RAS, Chernogolovka, Moscow District 142432, Russia ; Semenov, V.N. ; Glebovskiy, V.G. ; Bozhko, S.I.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

Single crystalline [001]-oriented tungsten tips have been applied for high resolution scanning tunneling microscopy (STM) studies of a Si(557) surface consisting of triple steps and 5×5-reconstructed Si(111) terraces. High stability of the W[001] tips allowed us to measure atomically resolved images of this unusual Si(557) reconstruction at various tunneling parameters and propose a model of its atomic structure. STM experiments show that even for nonideal probe geometry a realistic apex configuration can be drawn from the known crystallographic orientation and the tip behavior.

Published in:

Applied Physics Letters  (Volume:95 ,  Issue: 17 )