Cart (Loading....) | Create Account
Close category search window

Feature Selection Based on Mutual Information for Language Recognition

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Yan Deng ; Dept. of Electron. Eng., Tsinghua Univ., Beijing, China ; Jia Liu

The prevailing system for language recognition is the parallel phoneme recognition followed by vector space modeling (PPRVSM), which uses a vector space model to describe the cooccurrence information of phones. As the super-vectors are composed of phonetic N-Grams, so for high dimension vectors, there is a problem that the number of N-Grams grows exponentially as the order N increases, which will result in data sparseness. In this paper, we propose a feature selection algorithm to solve this problem, which uses the maximum relevance criteria based on mutual information to select the most discriminative N-Grams to identify languages. The effectiveness of the technique is demonstrated on the NIST 2005 language recognition 30-second task. And we achieve 4.81% in terms of equal-error-rate (EER).

Published in:

Image and Signal Processing, 2009. CISP '09. 2nd International Congress on

Date of Conference:

17-19 Oct. 2009

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.