By Topic

Modelling a resistive-reflector antenna by the complex source-dual series approach: the 2-D case of H-polarization

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Altintas, A. ; Bilkent Univ., Ankara, Turkey ; Nosich, A.I. ; Yurchenko, V.B.

Reflector antenna simulation is normally performed under an assumption of perfect conductivity of the reflector. Such antennas have been studied by using high-frequency asymptotic approaches like physical optics (in particular, aperture integration), geometrical theory of diffraction, ray tracing, etc., and numerical ones as method of moments (MoM). We have failed to find any published paper dealing with a resistive or impedance-surface reflector, and so we suppose that our analysis of resistive reflector beamforming can be of potential interest. Meanwhile, even for a perfectly conducting geometry, MoM results in prohibitively large CPU time, if a reflector is larger than 20 lambda. What is even more disappointing, MoM is known to be heavily inaccurate if a kind of resonance takes place. Therefore, in our analysis we use the method of regularization (MoR) modified by us for solving the scattering from a curved resistive strip. Besides, to simulate a directive feed in equally accurate manner, we use the complex source method (CSM). The latter is known as a very efficient way to account for the feed directivity without losing mathematical correctness. Worth noting also is the fact that here appear to be no problems occurring in ray-tracing analysis for blending the real-space edge diffraction points with complex-space reflection points. Thus, the analysis presented here is a recent development of our previous work.

Published in:

Antennas and Propagation Society International Symposium, 1995. AP-S. Digest  (Volume:2 )

Date of Conference:

18-23 June 1995