Cart (Loading....) | Create Account
Close category search window

Elliptically Contoured Distributions for Anomalous Change Detection in Hyperspectral Imagery

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Theiler, J. ; Los Alamos Nat. Lab., Los Alamos, NM, USA ; Scovel, C. ; Wohlberg, B. ; Foy, B.R.

We derive a class of algorithms for detecting anomalous changes in hyperspectral image pairs by modeling the data with elliptically contoured (EC) distributions. These algorithms are generalizations of well-known detectors that are obtained when the EC function is Gaussian. The performance of these EC-based anomalous change detectors is assessed on real data using both real and simulated changes. In these experiments, the EC-based detectors substantially outperform their Gaussian counterparts.

Published in:

Geoscience and Remote Sensing Letters, IEEE  (Volume:7 ,  Issue: 2 )

Date of Publication:

April 2010

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.