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The Thermal Resistance of Solder Joints in High Brightness Light Emitting Diode (HB LED) Packages

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2 Author(s)
Young-Bok Yoon ; Comput.-Aided Eng. Group, Samsung Electro-Mech. Co. Ltd., Suwon, South Korea ; Jin-Woo Park

We present a framework to calculate the thermal resistance of Au-Sn eutectic solder joint (Rth, Au-Sn joint) in high brightness light emitting diode (HB LED) packages whose heat extraction capability controls the optical efficiency and reliability of HB LEDs. Using the transient thermal measurement combined with the structure function based analytical method and the finite element method, we find that the thermal conductivity (k) of the thin solder joint becomes significantly smaller than the Au-Sn alloy after joining; hence, Rth, Au-Sn joint constitutes a large portion of the total Rth of the package (Rth PKG).

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Components and Packaging Technologies, IEEE Transactions on  (Volume:32 ,  Issue: 4 )