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Intel386 EX embedded processor IDDQ testing

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5 Author(s)
Ahuja, H. ; Semicond. Products Group, Intel Corp., Chandler, AZ, USA ; Arriens, D. ; Schneller, B. ; Verma, V.
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IDDQ testing, along with stuck-at fault, AC timing, and DC testing is increasingly considered a necessity for good product quality. This paper presents an IDDQ vector selection methodology, along with vector implementation in the production test program. IDDQ fault seeding results show that by stuck-at fault modeling, we can detect single stuck-at nodes that were not detected before. A comparative evaluation of conventional testing methods and IDDQ testing is presented. Experimental test results are presented that ascertain the effectiveness of IDDQ particularly how it overlaps with stuck-at fault coverage. A practical method that estimates the test coverage overlap is applied to reduce the stuck-at improvement effort and obtain “credit” towards the Intel386 EX processor quality requirements for production. A follow-on experiment for obtaining more data is proposed and data are being collected

Published in:

Test Conference, 1995. Proceedings., International

Date of Conference:

21-25 Oct 1995