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Time-Frequency Analysis for an Efficient Detection and Localization of Side-Coupled Cavities in Real Photonic Crystals

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10 Author(s)
Gottesman, Y. ; Lab. SAMOVAR UMRINT, T&M SudParis, Evry, France ; Combrie, S. ; DeRossi, A. ; Talneau, A.
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We propose and demonstrate here the high efficiency of concurrent time and frequency analysis to detect and unambiguously identify the coupled cavities in real photonic crystals containing imperfections and/or process-induced disorder. This procedure when applied to reflectograms recorded using phase-sensitive optical low-coherence reflectometry allows a straightforward and complete assessment of cavities (spectral and spatial localization in addition to photon lifetime) over a wide spectral range. Considering such a reflectogram (recorded in ~ 2 s), we show that this procedure greatly eases the evaluation of cavities under guiding conditions in real photonic crystals by discriminating their signature from the in-plane scattering induced by disorder.

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Lightwave Technology, Journal of  (Volume:28 ,  Issue: 5 )