Cart (Loading....) | Create Account
Close category search window
 

Imaging of Rough Surfaces Having Impedance Boundary Condition by the Use of Newton Iterative Algorithm

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Yelkenci, T. ; Fac. of Eng., Marmara Univ., Istanbul, Turkey

In this letter, an inverse scattering problem for the reconstruction of rough surfaces having standard impedance boundary condition (IBC) is presented. The method presented in this letter is the extension of a method given by Yapar to the case of IBC. The reconstruction is obtained from the scattered field measurements for a plane wave illumination of the inaccessible rough surface. Through a special representation of the scattered field in terms of a Fourier transformation and a Taylor series expansion, the problem is first reduced to a nonlinear operator equation. Then, this nonlinear equation is iteratively solved via the Newton method. Numerical results show that the method produces quite satisfactory results regardless of the values of the impedance.

Published in:

Geoscience and Remote Sensing Letters, IEEE  (Volume:7 ,  Issue: 1 )

Date of Publication:

Jan. 2010

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.