Referenced Items are not available for this document.
This paper proposes a new simulation-based fault modeling methodology. The methodology-an extension of Inductive Fault Analysis-uses the contamination-defect-fault simulator CODEF to directly relate effects of process-induced contamination to circuit-level malfunctions. The application of this methodology (called Inductive Contamination Analysis) is demonstrated by development of SRAM fault models
Published in:
Test Conference, 1995. Proceedings., International
Date of Conference: 21-25 Oct 1995
- Page(s):
- 552 - 560
- Meeting Date :
- 21 Oct 1995-25 Oct 1995
- ISSN :
- 1089-3539
- Print ISBN:
- 0-7803-2992-9
- INSPEC Accession Number:
- 5254183
- Conference Location :
- Washington, DC
- Digital Object Identifier :
- 10.1109/TEST.1995.529883
- Product Type:
- Conference Publications
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