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On combining design for testability techniques

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2 Author(s)
Parikh, P.S. ; AT&T Bell Labs., Naperville, IL, USA ; Abramovici, M.

In this paper, we present a testability-based method to combine three different DFT techniques: partial reset, partial observation, and partial scan. This approach combines the complementary strengths of the DFT techniques taking advantage of their different cost/benefit trade-offs, and results in more testable circuits with reduced design penalty

Published in:

Test Conference, 1995. Proceedings., International

Date of Conference:

21-25 Oct 1995