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Integrated test solutions and test economics for MCMs

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2 Author(s)
Kornegay, K.T. ; Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA ; Roy, K.

Multichip Modules (MCMs) use complex digital, analog, and mixed-signal chips on a single substrate from different vendors. To ensure quality of die and the functionality and performance of MCMs, extensive testing is required at all levels. This paper presents structured test methodologies for MCMs. The economics associated with these methodologies and their relative cost at the MCM level are also presented

Published in:

Test Conference, 1995. Proceedings., International

Date of Conference:

21-25 Oct 1995

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