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Room-temperature grain growth in sputtered nanoscale Pd thin films: Dynamic scaling behaviour on SiO2

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4 Author(s)
Ruffino, F. ; Dipartimento di Fisica e Astronomia and MATIS, Università di Catania, via S. Sofia 64, I-95123 Catania, Italy ; Irrera, A. ; De Bastiani, R. ; Grimaldi, M.G.

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Dynamic scaling behavior has been observed during the room-temperature growth of sputtered Pd films on SiO2 using the scanning electron microscopy technique. By the analyses of the dependence of the Pd grain size and surface density on the film thickness, the dynamical growth exponent z=4.2±0.3 was obtained, suggesting a conservative growth process. The analysis of the fraction of surface covered by Pd as a function of film thickness (up to a maximum of 8.5×1016 atoms/cm2, corresponding to 125 nm) allowed us to identify two different growth regimes in the investigated range: films thinner than 1.8×1016 atoms/cm2 (26.5 nm) that grow as an outside-cluster system and thicker film that exhibit an islandlike growth.

Published in:

Journal of Applied Physics  (Volume:106 ,  Issue: 8 )

Date of Publication:

Oct 2009

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