Cart (Loading....) | Create Account
Close category search window
 

40 to 85GHz power amplifier MMICs using an optical lithography based low cost GaAs PHEMT process

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Fujii, K. ; Avago Technol., San Jose, CA, USA ; Stanback, J. ; Morkner, Henrik

An optical photo lithography based 0.15 μm GaAs PHEMT process and 2 mil-substrate technology that enables high production throughput and low cost is described. The developed process achieved Imax = 575 mA/mm, BVgd = 14 V, and 753 mW/mm of output power density at P-1 condition at 18 GHz. Design and test results for balanced and single-ended power amplifiers (PA) for 40 to 85 GHz applications are described as process capability verification. Balanced PA MMICs shows 18 dB of small-signal gain and 17 dBm of output power up to 85 GHz frequencies. MMIC test results verified the process capability to manufacture MMIC devices for applications up to 90 GHz.

Published in:

Microwave Conference, 2009. EuMC 2009. European

Date of Conference:

Sept. 29 2009-Oct. 1 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.