IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Conference Publications > Lasers & Electro Optics & The ... Help

Time- and space-resolved emission spectroscopy of laser-induced plasma and its applications for trace element detection

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Motto-Ros, V. ; CNRS, Univ. de Lyon, Villeurbanne, France ; Boueri, M. ; Lei, Wenqi ; Ma, Qianli
more authors

Emission spectroscopy allows a precise diagnostics of laser ablation plasma with temporal and spatial resolutions. Such characterisation provides the basis for quantitative analysis of trace elements in different materials, polymers, fresh vegetables or speleothems.

Published in:
Lasers & Electro Optics & The Pacific Rim Conference on Lasers and Electro-Optics, 2009. CLEO/PACIFIC RIM '09. Conference on

Date of Conference: 30-3 Aug. 2009

Page(s):
1 - 2
E-ISBN :
978-1-4244-3830-3
Print ISBN:
978-1-4244-3829-7
INSPEC Accession Number:
10950379
Conference Location :
Shanghai
Digital Object Identifier :
10.1109/CLEOPR.2009.5292381
Product Type:
Conference Publications

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.