By Topic

Uncorrelated Discriminant Nearest Feature Line Analysis for Face Recognition

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Jiwen Lu ; Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore ; Yap-Peng Tan

We propose in this letter a new subspace learning method, called uncorrelated discriminant nearest feature line analysis (UDNFLA), for face recognition. Motivated by the fact that existing nearest feature line (NFL) can effectively characterize the geometrical information of face samples, and uncorrelated features are desirable for many pattern analysis applications, we propose using the NFL metric to seek a feature subspace such that the within-class feature line (FL) distances are minimized and between-class FL distances are maximized simultaneously in the reduced subspace, and impose an uncorrelated constraint to make the extracted features statistically uncorrelated. Experimental results on two widely used face databases demonstrate the efficacy of the proposed method.

Published in:

IEEE Signal Processing Letters  (Volume:17 ,  Issue: 2 )
IEEE Biometrics Compendium
IEEE RFIC Virtual Journal
IEEE RFID Virtual Journal