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Statistics on concurrent fault and design error simulation

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3 Author(s)
Grayson, B. ; Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA ; Shaikh, S.A. ; Szygenda, S.A.

Basic data of the nature presented here on fault and design error simulation processes have not been previously reported. Experiments are performed on c-sim, a gate level concurrent simulator developed at the University of Texas at Austin. Three types of statistics are considered: event based statistics, gate evaluation statistics and memory requirements. These statistics are important for design verification researchers and engineers for numerous reasons. For example, they help simulator developers tune up or optimize their concurrent simulators. They also fulfill the increasing need for experimental data concerning design error simulation. Most importantly, these statistics provide guidance to hardware accelerator designers in evaluating and comparing various design options

Published in:

Computer Design: VLSI in Computers and Processors, 1995. ICCD '95. Proceedings., 1995 IEEE International Conference on

Date of Conference:

2-4 Oct 1995