Cart (Loading....) | Create Account
Close category search window
 

Oversampled M-sequences for joint data and bit epoch estimation in DSSS transmissions

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Borio, D. ; Dept. of Geomatics Eng., Univ. of Calgary, Calgary, AB, Canada

The maximum likelihood (ML) estimator for the bit synchronization epoch and data bit values in direct-sequence spread-spectrum (DSSS) transmission consists of determining the binary sequence that maximizes the correlation with the recovered data samples. This requires the exhaustive test of all sequences generated by the different bit combinations and alignments, resulting in a computationally intensive process. In this letter, the properties of maximum length sequences (m-sequences) are exploited for testing all the bit combinations and alignments in parallel, leading to a computationally efficient implementation of the ML estimator. The case where the data bits are modulated by an overlay or secondary code is also considered and the proposed algorithm is generalized to include the effect of this additional modulation.

Published in:

Communications Letters, IEEE  (Volume:13 ,  Issue: 10 )

Date of Publication:

October 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.