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Statistics in Semiconductor Test: Going beyond Yield

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3 Author(s)
Daasch, W.R. ; Portland State Univ., Portland, OR, USA ; Shirley, G ; Nahar, A.

The quantity and complexity of data generated at each test manufacturing step can be daunting. This article, which emerged from a tutorial presented at ITC 2008, explains the application of statistics to help process that data and provides examples of how test has shifted from descriptive to predictive methods.

Published in:

Design & Test of Computers, IEEE  (Volume:26 ,  Issue: 5 )