Close category search window
 

Symbiotic Data Mining for Personalized Spam Filtering

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)

Unsolicited e-mail (spam) is a severe problem due to intrusion of privacy, online fraud, viruses and time spent reading unwanted messages. To solve this issue, Collaborative Filtering (CF) and Content-Based Filtering (CBF) solutions have been adopted. We propose a new CBF-CF hybrid approach called Symbiotic Data Mining (SDM), which aims at aggregating distinct local filters in order to improve filtering at a personalized level using collaboration while preserving privacy. We apply SDM to spam e-mail detection and compare it with a local CBF filter (i.e. Naive Bayes). Several experiments were conducted by using a novel corpus based on the well known Enron datasets mixed with recent spam. The results show that the symbiotic strategy is competitive in performance when compared to CBF and also more robust to contamination attacks.

Published in:
Web Intelligence and Intelligent Agent Technologies, 2009. WI-IAT '09. IEEE/WIC/ACM International Joint Conferences on  (Volume:1 )

Date of Conference: 15-18 Sept. 2009

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.