By Topic

Real time reduction of probe-loss using switching gain controller for high speed atomic force microscopy

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Agarwal, P. ; Department of Electrical and Computer Engineering, NanoDynamics Systems Laboratory, University of Minnesota–Twin Cities, Minneapolis, Minnesota 55455, USA ; De, Tathagata ; Salapaka, M.V.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

In this article, a switching gain proportional-integral-differential controller is used to reduce probe-loss affected regions in an image, obtained during tapping mode operation. Switching signal is derived from the “reliability index” signal, which demarcates regions where the tip has lost contact with the sample (probe-loss), within couple of cantilever oscillation cycles, thereby facilitating use of higher than optimal controller gain without deteriorating on-sample performance. Efficacy of the approach is demonstrated by imaging calibration sample at tip velocity close to 240 μm/s and plasmid DNA at tip velocity of 60 μm/s indicating significant reduction of probe-loss areas and recovery of lost sample features.

Published in:

Review of Scientific Instruments  (Volume:80 ,  Issue: 10 )