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Large scan area high-speed atomic force microscopy using a resonant scanner

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7 Author(s)
Zhao, B. ; Department of Physics and Astronomy and Department of Chemistry, University of Sheffield, Hounsfield Road, Sheffield S3 7RH, United Kingdom ; Howard-Knight, J.P. ; Humphris, A.D.L. ; Kailas, L.
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A large scan area high-speed scan stage for atomic force microscopy using the resonant oscillation of a quartz bar has been constructed. The sample scanner can be used for high-speed imaging in both air and liquid environments. The well-defined time-position response of the scan stage due to the use of resonance allows highly linearized images to be obtained with a scan size up to 37.5 μm in 0.7 s. The scanner is demonstrated for imaging highly topographic silicon test samples and a semicrystalline polymer undergoing crystallization in air, while images of a polymer and a living bacteria, S. aureus, are obtained in liquid.

Published in:

Review of Scientific Instruments  (Volume:80 ,  Issue: 9 )