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A 40-nm low-power SRAM with multi-stage replica-bitline technique for reducing timing variation

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6 Author(s)
Komatsu, S. ; Central Res. Lab., Hitachi, Ltd., Kokubunji, Japan ; Yamaoka, M. ; Morimoto, M. ; Maeda, N.
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A multi-stage replica bitline technique for reducing access time by suppressing enable timing variation of a sense amplifier was developed. Applied to a 288-kbit SRAM of the 40-nm process node, this technique achieves 6.1% access time reduction by reducing the sense-amplifier timing variation by 43%.

Published in:
Custom Integrated Circuits Conference, 2009. CICC '09. IEEE

Date of Conference: 13-16 Sept. 2009

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