Referenced Items are not available for this document.
This paper describes a novel technique to generate test vectors for single stuck-at faults using the behavioral description of the circuit function and the mapping from the behavior into the hardware that implements it. The test vector generation problem is formulated as a mixed integer nonlinear programming (MINLP) problem, and the test vectors are obtained by solving a series of MINLPs. The technique has been implemented and results from this approach show an order of magnitude speed up in test generation compared to existing gate-level sequential test generation tools
Published in:
Test Conference, 1994. Proceedings., International
Date of Conference: 2-6 Oct1994
- Page(s):
- 958 - 967
- Meeting Date :
- 02 Oct 1994-06 Oct 1994
- ISSN :
- 1089-3539
- Print ISBN:
- 0-7803-2103-0
- INSPEC Accession Number:
- 4847068
- Conference Location :
- Washington, DC
- Digital Object Identifier :
- 10.1109/TEST.1994.528045
- Product Type:
- Conference Publications
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