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Behavioral test generation using mixed integer nonlinear programming

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2 Author(s)
R. S. Ramchandani ; Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA ; D. E. Thomas

This paper describes a novel technique to generate test vectors for single stuck-at faults using the behavioral description of the circuit function and the mapping from the behavior into the hardware that implements it. The test vector generation problem is formulated as a mixed integer nonlinear programming (MINLP) problem, and the test vectors are obtained by solving a series of MINLPs. The technique has been implemented and results from this approach show an order of magnitude speed up in test generation compared to existing gate-level sequential test generation tools

Published in:

Test Conference, 1994. Proceedings., International

Date of Conference:

2-6 Oct1994